Abstract The need for understanding the low-frequency noise (LFN) of metal oxide semiconductor thin-film transistors (TFTs) is increasing owing to the substantial effects of LFN in various circuit applications. A focal point of inquiry pertains to the examination of LFN amidst bias stress conditions. known to compromise TFT reliability. In this study. https://unitedssports.shop/product-category/soccer-clothing-mens-tops-jackets/